MICROTECH manufacturing Tablet Sub-micron indicator with external probe adopted to Industry 4.0 Tablet indicators are using computerized measuring system developed and patented by MICROTECH (Patents UA126928, UA99686) with 0.1 micron resolution. Computerized Tablet indicators can be using for precision linear measuring or in custom stands and devices for Radius, Sphere and others. External probe can be with length 2-10m that gives wide range of installation possibilities.
TABLET measuring module of indicator has such functions :